Lecture Notice

Published on 2017/5/25

Time: 9:00 a.m.-10:00a.m, 27th , May

Place: Zhuoyue Building 806

Speaker 1: Dr. Bharat Bhuva, Professor of Vanderbilt University, USA(范德堡大学教授)

Bharat Bhuva is a professor with Vanderbilt university since graduating with a Ph.D. degree from North Carolina State University. His main research interest is radiation effects on microelectronic devices, circuits, and systems. He has led research groups that have characterized fabrication processesandcircuits for radiation effects sincethe 130-nm node.

TopicEffects of combined environments on single-event response of flip-flops at the 20-nm technology node

Speaker 2: Dr. ShiJie Wen, Distinguished Engineer of Cisco, USA(美国思科公司卓越工程师)

ShiJie Wen, as a distinguished engineer, has been with Cisco for the past 14 years. He has been working on technology and reliability for silicon technology, semiconductor components, memory technology, system architecture, networking products and field customer experience.

TopicSystem view of SEU error handling and resilience

Welcome to attend!


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